Research / Core Facilities / Imagopole / Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy

Definition

Scanning Electron Microscopy (SEM) is a technique based on the principle of electron-matter interactions. An electron bean is directed at the surface of a sample and the reflected electrons are analysed, producing a high resolution surface image.

The PFMU has a JEOL 6700F microscope equiped with three detectors: an LEI (Lower Electron Image), an SEI (Secondary Electron Image) for morphological studies and a YAG (Yttrium Aluminium Garnet) for immunolabeling observation.

 


strepto
SEM Immunolabeling  – Pilus immunolabeling of Streptococcus agalactiae (10nm gold particules) / Unité de Recherche Biologie des Bactéries pathogènes à Gram-positif
The JEOL 6700F also has a cryo system allowing observation of samples at low temperature. This mode can be used in cases where chemical treatments affect the preservation of the sample. Often, hydrated samples such as biofilms are investigated using this technique.